/Analytical Instrumentation MCQ Question Set 12 MCQS HUB ,Sample Test,Sample questions

Question:
 A magnetic sector alone can be used as a mass spectrometer, with roughly _____ resolution.

1.Low

2.High

3. Unit

4.infinite


Question:
 Discrete electrons cannot be observed in electron ionization of an atom due to which of the following reasons?

1. Environmental disturbances

2.Same mass

3.Same charge

4.Electron- electron interaction


Question:
 Electron spectroscopy is based on the ionization phenomenon.

1.True

2.False

3.all of the above

4.None of the mentioned


Question:
 ESCA can identify elements in the periodic table above which of the following?

1.Carbon

2.Boron

3.Helium

4.Potassium


Question:
 ESCA gives sufficient chemical information up to a depth about ________ armstrong in oxide.

1. 5-20

2.15-40

3. 40-100

4.100-200


Question:
 In reverse-geometry mass spectrometer which of the following precedes the electric sector?

1. Nebulizer

2.Orifice

3.Magnetic sector

4.Mass spectrometer


Question:
 In tandem spectroscopy, the first stage sepatation device is a mass spectrometer.

1. True

2.False

3.all of the above

4.None of the mentioned


Question:
 Introduction of total HPLC effluent into MS is feasible.

1.True

2.False

3.all of the above

4.None of the mentioned


Question:
 The system for measurement of ion intensity in GS-MS system consists of which of the following?

1.Electrometer

2.Ion meter

3. Ion transducer

4.Intensity meter


Question:
 Which of the following should be in a position to split the effluent?

1. Interface

2.Ion source

3.Makeup gas

4.Microbore


Question:
284.6 eV matches which of the following specific atom type?

1.Carbon

2.Oxygen

3.Nitrogen

4.Argon


Question:
A tandem mass spectrometer has which of the following analysers?

1. Time of flight mass analyser

2. Magnetic deflection analyser

3.Radiofrequency analyser

4.Quadrupole analyser


Question:
All ions with the same number of charges will have ______

1.Same kinetic energy

2.Different kinetic energies

3.Same mass

4.Different mass


Question:
B/E scan is which of the following scans?

1.Product ion scan

2. Precursor ion scan

3. Mass scan

4.Charge scan


Question:
ESCA focusses on which of the following information?

1.Mass of the electron

2.Charge of the electron

3. Binding energy of the electron

4.Mass of atoms


Question:
ESCA gives sufficient chemical information up to a depth about ________ armstrong in metals.

1.5-20

2.15-40

3.40-100

4.100-200


Question:
ESCA gives sufficient chemical information up to a depth about ________ armstrong in polymers.

1. 5-20

2.15-40

3.40-100

4.100-200


Question:
Gas burden from conventional LC flow rates is which of the following?

1.1ml/min of water produces 1.2 l/mm of gas

2.1ml/min of water produces 2.4 l/mm of gas

3.2ml/min of water produces 3.2 l/mm of gas

4. 1ml/min of water produces 4.2 l/mm of gas


Question:
In MIKES experiments which of the following are measured?

1.Product ions

2.Product ion kinetic energies

3. Product ions mass to charge ratio

4.Product ions masses


Question:
In surface spectrometer, which of the following beam is analysed?

1.Reflected beam

2.Absorbed beam

3.Refracted beam

4. Incident beam


Question:
In the spectrum, two main peaks at _________ and ________ are observed.

1.284.6, 532.5

2. 248.6, 523.5

3. 264.8, 535.2

4.246.8, 553.2


Question:
Ion etching techniques provides the depth profiling from the surface.

1.True

2.False

3.all of the above

4.None of the mentioned


Question:
Only ______ percent of the effluent of the liquid chromatography must be introduced in the mass spectrometer.

1.1-2 %

2.1-5 %

3. 1-20 %

4.1-15 %


Question:
Surface analysis can provide information that classic methods like microscopic cannot.

1.True

2.False

3.all of the above

4.None of the mentioned


Question:
Surface analysis cannot provide any chemical information directly.

1.True

2.False

3.all of the above

4.None of the mentioned


Question:
Surface is usually more than _____ atomic layer deep and is a region of ________ atomic potentials.

1.One, uniform

2.One, non-uniform

3.Two, uniform

4.Two, non-uniform


Question:
Tandem mass spectroscopy combines which of the following devices?

1. Mass spectrometer and gas-solid chromatograph

2.Mass spectrometer and gas-liquid chromatograph

3. Mass spectrometer and gas chromatograph

4.Mass spectrometer and mass spectrometer


Question:
The carrier gas with low molecular weight would diffuse at a higher rate than the higher molecular weight sample.

1.True

2.False

3.all of the above

4.None of the mentioned


Question:
The final MS/MS spectrum consists only of product ions from the selected precursor.

1. True

2.False

3.all of the above

4.None of the mentioned


Question:
The gas burden from conventional LC flow rates creates nearly _____ times more gas than cryo-pumped vacuum system can handle.

1.5

2.10

3.20

4.40


Question:
The ions are focussed and de-clustered through which of the following regions?

1.Dry helium region

2.Wet oxygen region

3.Wet chlorine region

4.Dry nitrogen region


Question:
The ions are passed into the high vacuum analyser through which of the following?

1. Orifice

2.Nozzle

3.Nebulizer

4. Venturi tube


Question:
The kinetic energy of the ejected photoelectron is dependent upon the energy of which of the following?

1. Ions around

2.Photons around

3.Material

4.Impinging photon


Question:
The kinetic energy of the photoelectron energies is dependent on _________ of the atom, which makes XPS useful to identify the oxide state.

1.Mass

2.Charge

3.Chemical environment

4.Volume


Question:
The mass-selected ions are activated in which of the following ways that cause them to fall apart to produce product ions?

1.Collisional activation

2.Evaporational activation

3.Inert gas activation

4.Thermal activation


Question:
Using an interface would reduce detection limit and sensitivity.

1.True

2.False

3.all of the above

4.None of the mentioned


Question:
What does the acronym ‘MIKES’ stand for?

1.Mass-analysed ion kinetic energy spectrometer

2.Mass-based induced kinetic energy spectrometer

3.Mass invasive kinetic electric spectrometer

4.Mass-analyser in a kinetic energy-type spectrometer


Question:
Which of the following filters are used in tandem spectrometer?

1.Quadrupole mass filter

2. Low energy filter

3. High energy filter

4.Time of flight mass filter


Question:
Which of the following is a type of electron spectroscopy?

1.MIKES

2.Auger spectroscopy

3.Secondary ion mass spectroscopy

4.Ion scattering spectroscopy


Question:
Which of the following is also known as X-ray photoelectron spectroscopy?

1.Auger electron spectroscopy

2. Electron impact spectroscopy

3. Electron spectroscopy for chemical analysis

4. Secondary ion mass spectroscopy


Question:
Which of the following is located in the region between two analysers?

1. Nebuliser

2.Collision cell

3. Filter

4.Vacuum chamber


Question:
Which of the following is the abbreviation of ESCA?

1. Electron scattering chemical analysis

2.Emission spectroscopy combination analysis

3.Electron spectroscopy for chemical analysis

4. Electron spectrum chemically analysed


Question:
Which of the following is the abbreviation of SIMS?

1. Secondary ion mass spectroscopy

2.Spectrum ionization mass spectroscopy

3. Scattering ions mass spectroscopy

4.Spectral ionization mass spectroscopy


Question:
Which of the following is the most commonly used interface?

1.Nebulizer

2.Chopper

3.Filter

4.Vapourising chamber


Question:
Which of the following is the normal nebuliser temperature used in LC mass spectrometry?

1. 50-100oC

2.100-200oC

3.125-150oC

4. 150-200oC


Question:
Which of the following is the type of separator used in commercial GC-MS systems?

1. Jet type molecular separator

2.Porous tube

3. Teflon tube

4. Flow type separator


Question:
Which of the following is used to separate a single mass that is characteristic of a given analyte in a mixture?

1.First mass spectrometer

2.Second mass spectrometer

3.Filter

4.Precursor


Question:
Which of the following methods use soft X-rays to eject electrons from inner shell orbitals?

1.Auger electron spectroscopy

2.Electron impact spectroscopy

3.Electron spectroscopy for chemical analysis

4.Secondary ion mass spectroscopy


Question:
Which of the following methods utilizes the emission of low energy electrons in a process?

1.Auger electron spectroscopy

2.Electron impact spectroscopy

3. Electron spectroscopy for chemical analysis

4.Secondary ion mass spectroscopy


Question:
Which of the following problems occur when combining gas chromatography and mass spectroscopy?

1.Difference in operating pressures

2. Reduction in sensitivity

3.Direct identification is not possible

4.It does not permit direct introduction of the effluent


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